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The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Advantest Corporation
The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Founded in Tokyo in 1954, Advantest is a global company with facilities. The result: excellent mechanical and electrical contact is assured. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. Reducing loadboard complexity in Power Applications. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. The more that could be run in parallel, the greater the test time savings. 0000008392 00000 n
Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. Extends Highly Parallel Testing Capabilities. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. Release 5.4.3. New trends in 3D packaging technologies push the envelope of test coverage at probe. 0000006781 00000 n
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The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000085770 00000 n
With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. 0000057829 00000 n
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Click on more information for further details. The result: excellent mechanical and electrical contact is assured. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. . Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. 3DIC test software development, integration and maintenance. Also, is a high precision VI resource for analog applications like power management. Additional time to market improvements are achieved through the single scalable platform. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. 0000031694 00000 n
Digital devices (logic and memory) lead the process technology shrink steps in the industry. It is suited for automotive, industrial and consumer IC testing. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R}
JRWz fz&pTP ML>"CgT; HH~H>EHy Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. 0000168589 00000 n
By clicking any link on this page you are giving consent for us to set cookies. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. This class introduces the V93000 SOC Series (using Smart Scale cards). In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports Targeted at differential serial PHY technology in characterization and volume manufacturing. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. It improves throughput while maintaining compatibility with the established MBAV8 instrument. In the past, RF parts were separate, individual "jelly bean" parts. Training needs are limited due to a single, familiar test system. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. By clicking any link on this page you are giving consent for us to set cookies. TSE: 6857. FEb2 ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. ATE to ATE Conversion. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. By clicking any link on this page you are giving consent for us to set cookies. 0000013109 00000 n
The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. 0000059009 00000 n
The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. Click on more information for further details. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Older testers having single clock domains and primitive The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. 0000011683 00000 n
With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. 0000349795 00000 n
The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. Agenda www.chiptest.in 3. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. HLUPTG}@;O
The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. The platform has become the all purpose reference platform. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. Auto Loading / Unloading Feature for Manual Equipment . %PDF-1.4
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TSE: 6857. TSE: 6857. 0000059144 00000 n
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Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. 0000006289 00000 n
Click on more information for further details. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . Advantest Corporation
It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. 0000001756 00000 n
For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. TSE: 6857. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. 0000012183 00000 n
E-mail Kantor : spiuho@uho.ac.id 0000031852 00000 n
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Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. 0000007336 00000 n
A test program verification tool suite . In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. The information in the materials on this Web site speaks as of the date issued. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. 0000007267 00000 n
83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. 0000003026 00000 n
Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. 0000058780 00000 n
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u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. The user benefits are reduced test time, best repeatability and simplified program creation. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. 0000058694 00000 n
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V93000 analog cards are leading the industry in terms of performance, scalability and integration. 0000079887 00000 n
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Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. yc+5I|w&-/-6d0E^ [6cf,/* Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. 0000009749 00000 n
Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. Satuan Pengawas Internal UHO 2021. 0000016567 00000 n
Each channel comes with a high voltage TMU for direct timing measurements on power signals. 0000009007 00000 n
Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. 0000012048 00000 n
A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: Advantest. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. Click on more information for further details. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Smart Test, Smart ATE, Smart Scale. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure.
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